Methods for measuring electrical properties of electro-optic displays
US11854448B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 27, 2022 |
| Grant date | Dec 26, 2023 |
| Priority date | — |
| Expiry date | Dec 27, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG09G2320/08
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A method for driving electro-optic displays including electro-optic material disposed between a common electrode and a backplane. The backplane includes an array of pixel electrodes, each coupled to a transistor. A display controller applies waveforms to the pixel electrodes. The method includes applying first measurement waveforms to a first portion of the pixel electrodes. During each frame of the first measurement waveforms, the same time-dependent voltages are applied to each pixel electrode of the first portion of pixel electrodes. The method includes determining the impedance of the electro-optic material in proximity to the first portion of pixel electrodes based on a measurement of the current flowing through a current measurement circuit and the time-dependent voltages applied to each pixel electrode during the first measurement waveforms, and selecting driving waveforms based on the impedance of the electro-optic material in proximity to the first portion of pixel electrodes.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.