Systems and methods for performing temperature-dependent reference image correction for light projectors
US11856180B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 30, 2022 |
| Grant date | Dec 26, 2023 |
| Priority date | — |
| Expiry date | Jun 30, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T7/521
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
One disclosed embodiment includes techniques for temperature-dependent reference image correction in structured light projectors that may be used for generating three-dimensional (3D) scene depth maps. The techniques disclosed herein include receiving an indication of a temperature (e.g., an actual current operating temperature or a change in the current operating temperature relative to an established reference temperature) associated with one or more components of a projector and then determining, based on the temperature indication, an amount of adjustment needed to correct a reference pattern image based on an estimated effective focal length change of the projector. Next, a reference pattern image may be appropriately adjusted, e.g., based on the determined amount of effective focal length adjustment caused by the current operating temperature of the projector, to generate a corrected reference image, which may then be used to generate a more accurate 3D scene depth maps at the projector's current operating temperature.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.