Patent · US Active

Defect detection for additive manufacturing systems

US11858207B2 · kind B2 · utility

0Cited by
95References
11Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 21, 2023
Grant dateJan 2, 2024
Priority date
Expiry dateFeb 21, 2043

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY02P10/25
  • WIPO fieldMaterials, metallurgy
  • WIPO sectorChemistry

Abstract

This invention teaches a quality assurance system for additive manufacturing. This invention teaches a multi-sensor, real-time quality system including sensors, affiliated hardware, and data processing algorithms that are Lagrangian-Eulerian with respect to the reference frames of its associated input measurements. The quality system for Additive Manufacturing is capable of measuring true in-process state variables associated with an additive manufacturing process, i.e., those in-process variables that define a feasible process space within which the process is deemed nominal. The in-process state variables can also be correlated to the part structure or microstructure and can then be useful in identifying particular locations within the part likely to include defects.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.