Method for examining a coating of a probe surface
US11859962B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 9, 2020 |
| Grant date | Jan 2, 2024 |
| Priority date | — |
| Expiry date | May 6, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/2441
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Described herein is a method for examining a coating of a probe surface, including the steps of providing sensing data indicative of a depth of the coating at each of a predetermined subset of probe surface points, determining a depth representation of the coating from the sensing data, and deriving a coating property based on the depth representation. The coating property carries objective information about a geometric constitution or structure of the coating, which can be used for assessing the coating with respect to a functionality that is due to its geometric constitution or structure.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.