Map data validation using knowledge graphs and randomness measures
US11859985B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 21, 2019 |
| Grant date | Jan 2, 2024 |
| Priority date | — |
| Expiry date | Dec 4, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06N5/04
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Systems and methods are disclosed for improved mapping data validation using randomness measures. Methods may include receiving a map dataset that includes a plurality of map features. A knowledge graph may be generated based on the map dataset that may include nodes representing or corresponding to the map features. Nodes corresponding to map features of a particular feature type may be identified and edges connected to the identified nodes may be processed to identify a plurality of paths. A randomness measure for the particular feature type may be determined based on the plurality of paths. The randomness measure may indicate a predictability of occurrences of map features of the particular feature type in the map dataset. The randomness measure may then be compared to a second randomness measure determined based on another map dataset.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.