Patent · US Active

Sample identification

US11860103B2 · kind B2 · utility

0Cited by
9References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 4, 2022
Grant dateJan 2, 2024
Priority date
Expiry dateApr 23, 2042

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2201/068
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method of analyzing a sample is disclosed. The method includes the steps of measuring a spectral response of the sample, selecting a reference material having a Raman peak with a magnitude at a wave number, measuring a peak value in the spectral response at the wave number, and determining an amount of the reference material in the sample based in part on a ratio of the measured peak value to the magnitude of the Raman peak of the reference material.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.