Material analysis device with quick attachment

US11860132B2 · kind B2 · utility

Assignee

• NETZSCH-Gerätebau GmbH · DE

Inventors

• Georg Neumann · Inzell, DE
• Marco Zier · Fichtelberg, DE
• Patrick Biermann · Seelze, DE
• Jürgen Tschöpel · Arzberg, DE
• Reinhard Gschwendtner · Marktredwitz, DE
• Wiebold Wurpts · Grindau, DE
• Markus Hilmer · Lehrte, DE
• Leonhard Faulhammer · Selb, DE
• Stephan Lauer · Brelingen, DE
• Kai Dinges · Grethem, DE
• Claas Luhmann · Farster Bauerschaft, DE
• Michel Bellmann · Brelingen, DE
• Georg Storch · Selb, DE

Key dates

• Filing date: May 5, 2022
• Grant date: Jan 2, 2024
• Expiry date: Aug 30, 2042

Classification

• Technology area (CPC G): Physics
• CPC primary: G01N2203/0228
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A material analysis device for analysing a material sample. The material analysis device is equipped with a—generally temperature-controllable—sample chamber and a sample holder, which, supported by at least one pillar, protrudes into the sample chamber, and a loading shaft, to one end of which force is applied by an exciter, and the other end of which bears a connecting member, with which it transmits force to the sample in a defined manner and loads same thereby.