Automatic testing method and automatic testing device employing the method
US11860612B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 27, 2022 |
| Grant date | Jan 2, 2024 |
| Priority date | — |
| Expiry date | Jul 14, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG05B2219/32368
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An automatic testing method includes obtaining a positioning image, analyzing position of a plurality of slots of the test motherboard in the positioning image to generate route information for insertion and testing of components; wherein photographing test motherboard and obtaining positioning image focused on the test motherboard, controlling the clamping device to insert a plurality of the components into the slots according to the route information, controlling the test motherboard to test the components, determining if there is a faulty component, controlling the clamping device to withdraw and insert the components into other slots according to the route information and controlling the test motherboard to retest the components again if there is no faulty component. An automatic testing device and a non-volatile storage medium performing the above-described method are also disclosed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.