Semiconductor device, control flow inspection method, non-transitory computer readable medium, and electronic device
US11860762B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 25, 2019 |
| Grant date | Jan 2, 2024 |
| Priority date | — |
| Expiry date | Jul 9, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/3688
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A semiconductor device (100) includes: first storage means (110) storing, in advance, a plurality of pieces of execution order inspection information (111˜11n) used for inspection of an execution order of a plurality of code blocks in a predetermined program, second storage means (120), which is a cache for the first storage means, and prediction means (130) for predicting a storage area of the execution order inspection information based on prediction auxiliary information in a first code block of the plurality of code blocks and a control flow graph of the program, the storage area being a prefetch target to be prefetched from the first storage means to the second storage means.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.