Patent · US Active

System and method for extracting planar surface from depth image

US11861840B2 · kind B2 · utility

0Cited by

1References

20Claims

0Family size

Assignee

SHANGHAITECH UNIVERSITY · CN

Inventors

Ziran Xing · Shanghai, CN
Zhiru Shi · Wooster, US
Yi Ma · Shanghai, CN
Jingyi YU · Shanghai, CN

Key dates

Filing date	Mar 31, 2021
Grant date	Jan 2, 2024
Priority date	—
Expiry date	Jul 15, 2042

Classification

Technology area (CPC G)Physics
CPC primaryG06T2207/20021
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

According to some embodiments, an imaging processing method for extracting a plurality of planar surfaces from a depth map includes computing a depth change indication map (DCI) from a depth map in accordance with a smoothness threshold. The imaging processing method further includes recursively extracting a plurality of planar region from the depth map, wherein the size of each planar region is dynamically adjusted according to the DCI. The imaging processing method further includes clustering the extracted planar regions into a plurality of groups in accordance with a distance function; and growing each group to generate pixel-wise segmentation results and inlier points statistics simultaneously.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.