Patent · US Active

Method for calibrating an irradiation device

US11865770B2 · kind B2 · utility

0Cited by

2References

20Claims

0Family size

Assignee

Concept Laser, GmbH · DE

Inventors

Tim Klaußner · Kronach, DE
Christian Dicken · Weidenberg, DE
Bertram Gärber · Neustadt, DE

Key dates

Filing date	Mar 4, 2019
Grant date	Jan 9, 2024
Priority date	—
Expiry date	Sep 26, 2041

Classification

Technology area (CPC Y)Emerging Cross-Sectional Technologies
CPC primaryY02P10/25
WIPO fieldOther special machines
WIPO sectorMechanical engineering

Abstract

Method for calibrating an irradiation device (2) for additively manufacturing three-dimensional objects which irradiation device (2) comprises at least two irradiation units (3, 4), comprising: guiding one of the at least two energy beams (6, 10) via the corresponding irradiation unit (3, 4) to a determination region (15), preferably a part of a build plane (8), for generating a calibration pattern (18, 19); imaging at least one part of the determination region (15) to an on-axis determination unit (12, 14) of the at least one other irradiation unit (3, 4); determining a position of the calibration pattern (18, 19) in the determination region (15) on basis of the image of the at least one part of the determination region (15); generating calibration information relating to a calibration status of at least one part of the irradiation device (2) based on the position of the calibration pattern (18, 19).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.