Phase measurement method and signal processing device
US11867555B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 19, 2020 |
| Grant date | Jan 9, 2024 |
| Priority date | — |
| Expiry date | Dec 30, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01D5/35383
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
It is intended to provide a phase measurement method and a signal processing device that are capable of reducing influence of noise of a measuring device without increasing the peak intensity of an incident light pulse when measuring the phase of scattered light in DAS-P.A phase measurement method according to the present invention causes wavelength-multiplexed pulse light to be incident on a measurement target optical fiber, produces a scattered light vector obtained by plotting scattered light from the measurement target optical fiber for each wavelength onto a two-dimensional plane having the in-phase component thereof on the horizontal axis and the orthogonal component thereof on the vertical axis, rotates the produced scattered light vector for each wavelength at each place in the measurement target optical fiber to align the directions of the vectors, generates a new vector by calculating the arithmetic average of the vectors having the aligned directions, and calculates the phase by using the values of the in-phase and orthogonal components of the generated new vector.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.