Spectrometer including metasurface
US11867556B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Sep 27, 2021 |
| Grant date | Jan 9, 2024 |
| Priority date | — |
| Expiry date | Dec 10, 2041 |
Classification
- Technology area (CPC B)Performing Operations; Transporting
- CPC primaryB82Y20/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A spectrometer includes a transparent substrate including a first surface and a second surface that face each other and are substantially parallel to each other; a slit provided on the first surface and through which light is incident onto the transparent substrate; a spectrum optical system including metasurface including a plurality of nanostructures that are two-dimensionally arranged and satisfy a sub-wavelength scattering condition, wherein the metasurface includes a focusing metasurface which includes first nanostructures of the plurality of nanostructures, and is configured to reflect, disperse, and focus the light incident thereon through the slit, at different angles based on respective wavelengths; and a sensor configured to receive the light from the focusing metasurface. When L is a total length of an optical path from the slit to the sensor and D is a thickness of the transparent substrate, L and D satisfy the following inequality: L/D>3.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.