Patent · US Active

Parameter setting method and apparatus, system, and storage medium

US11867760B2 · kind B2 · utility

0Cited by
5References
12Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJun 17, 2021
Grant dateJan 9, 2024
Priority date
Expiry dateFeb 18, 2042

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C29/56012
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The present application provides a parameter setting method and apparatus, a system, and a storage medium. The parameter setting method includes: obtaining first setting values of multiple memory parameters and storage locations of the multiple memory parameters in a non-volatile memory; generating a first parameter setting instruction according to the first setting value and the storage location of each memory parameter; and sending the first parameter setting instruction to a test device, so that the test device sets the memory parameter stored at the storage location in the non-volatile memory as the first setting value.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.