Patent · US Active

System, method, and computer program for defect resolution

US11868208B1 · kind B1 · utility

0Cited by
3References
17Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 24, 2022
Grant dateJan 9, 2024
Priority date
Expiry dateMay 24, 2042

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F11/1476
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

As described herein, a system, method, and computer program are provided for defect resolution. Information associated with a defect detected in a computer system is received. The information is processed, using a first machine learning model, to predict a source of the defect. The information and the source of the defect are processed, using a second machine learning model, to predict one or more parameters for handling the defect. One or more actions are caused to be performed to resolve the defect, based on the predicted one or more parameters for handling the defect.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.