Semiconductor device, control flow inspection method, non-transitory computer readable medium, and electronic device
US11868467B2 · kind B2 · utility
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12Claims
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Key dates
| Filing date | Jun 25, 2019 |
| Grant date | Jan 9, 2024 |
| Priority date | — |
| Expiry date | Sep 26, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F21/565
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A semiconductor device (100) includes: a determination unit (110) configured to determine whether an avoidance condition of inspection of control flow integrity is satisfied (e.g., a degree of similarity with a previous input value is in a predetermined range) based on determination auxiliary information, which is at least an input value in a target code block to be executed among a plurality of code blocks in a predetermined program, and an inspection unit (120) configured to avoid inspection of control flow integrity in the target code block when it is determined that the avoidance condition is satisfied.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.