Patent · US Active

Analysis device, analysis method, and analysis program

US11868853B2 · kind B2 · utility

0Cited by
4References
7Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 19, 2017
Grant dateJan 9, 2024
Priority date
Expiry dateApr 2, 2040

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06N5/045
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

An input unit receives an input of data, as learning purpose data and determination target data, in which requests made to a server by a user are represented in a time series. Then, a shaping unit shapes the received data. A classifying unit classifies the shaped data for each user who made the requests. Then, a learning unit extracts, from the classified learning purpose data, consecutive n requests as feature values of the learning purpose data, performs learning by using the feature values of the learning purpose data, and creates a profile for each user. A determination unit extracts, from the classified determination target data, consecutive n requests as feature values of the determination target data and performs determination of the determination target data based on the feature values of the determination target data and based on the profiles created by the learning unit.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.