Method for manufacturing system analysis and/or maintenance
US11868971B2 · kind B2 · utility
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4References
20Claims
0Family size
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Key dates
| Filing date | Feb 1, 2023 |
| Grant date | Jan 9, 2024 |
| Priority date | — |
| Expiry date | Feb 1, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06Q10/20
- WIPO fieldIT methods for management
- WIPO sectorElectrical engineering
Abstract
A method for factory analysis and/or maintenance, preferably including receiving factory information and/or associating metrics with factory components, and optionally including acting based on defect associations and/or operating factory machines. The method is preferably associated with one or more manufacturing systems and/or elements thereof.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.