Method for temperature compensation of a microelectromechanical sensor, and microelectromechanical sensor
US11874291B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 27, 2022 |
| Grant date | Jan 16, 2024 |
| Priority date | — |
| Expiry date | Apr 27, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01P2015/0862
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for temperature compensation of a MEMS sensor. The method includes: in a balancing step, a temperature gradient is produced by a thermal element and a first and a second temperature are determined at a first and a second temperature measurement point, wherein a deflection of a movable structure produced by the temperature gradient is measured and a compensation value is ascertained dependent on the first and second temperature and the deflection; in a measurement step, a physical stimulus is measured by way of a deflection of the movable structure and a third and fourth temperature is determined at the first and second temperature measurement points; in a compensation step, a measured value of the physical stimulus is ascertained dependent on the measured deflection, the third and fourth temperature and the compensation value. A method is also provided including: a regulation step, and a measurement step.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.