Patent · US Active

Method for temperature compensation of a microelectromechanical sensor, and microelectromechanical sensor

US11874291B2 · kind B2 · utility

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15Claims
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Key dates

Filing dateApr 27, 2022
Grant dateJan 16, 2024
Priority date
Expiry dateApr 27, 2042

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01P2015/0862
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method for temperature compensation of a MEMS sensor. The method includes: in a balancing step, a temperature gradient is produced by a thermal element and a first and a second temperature are determined at a first and a second temperature measurement point, wherein a deflection of a movable structure produced by the temperature gradient is measured and a compensation value is ascertained dependent on the first and second temperature and the deflection; in a measurement step, a physical stimulus is measured by way of a deflection of the movable structure and a third and fourth temperature is determined at the first and second temperature measurement points; in a compensation step, a measured value of the physical stimulus is ascertained dependent on the measured deflection, the third and fourth temperature and the compensation value. A method is also provided including: a regulation step, and a measurement step.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.