Contact probe and probe unit
US11874300B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 26, 2022 |
| Grant date | Jan 16, 2024 |
| Priority date | — |
| Expiry date | Apr 26, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/06738
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A contact probe includes: a first contact member; a second contact member; and a spring member. The first contact member includes: a first tip part configured to contact a first contact target; and a boss part configured to couple with the spring member by fitting into the spring member, and the second contact member includes: a second tip part configured to contact a second contact target; and a cylindrical part extending from the second tip part and having a cylindrical shape with an inner circumference having a uniform diameter, the cylindrical part being engaged with at least a portion of the spring member, the portion of the spring member that is engaged with the cylindrical part having a diameter larger than the other portion of the spring member, the entire spring member being configured to be housed in the cylindrical part when the spring member is contracted.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.