Patent · US Active

Normalization method for machine-learning and apparatus thereof

US11875257B2 · kind B2 · utility

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10Claims
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Key dates

Filing dateMay 14, 2021
Grant dateJan 16, 2024
Priority date
Expiry dateNov 30, 2041

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06V10/7715
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A normalization method for machine learning and an apparatus thereof are provided. The normalization method according to some embodiments of the present disclosure may calculate a value of a normalization parameter for an input image through a normalization model before inputting the input image to a target model and normalize the input image using the calculated value of the normalization parameter. Because the normalization model is updated based on a prediction loss of the target model, the input image can be normalized to an image suitable for a target task, so that stability of the learning and performance of the target model can be improved.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.