Systems and methods for determining scanning parameter in imaging
US11877873B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 18, 2020 |
| Grant date | Jan 23, 2024 |
| Priority date | — |
| Expiry date | Aug 28, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/20081
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Systems and methods for determining at least one scanning parameter for a scanning by an imaging device (110) are provided. The methods may include obtaining a scout image of at least one portion of a subject (502), and determining, in the scout image, a region of interest (ROI) corresponding to the at least one portion of the subject (504). The methods may further include determining, based on the ROI, the at least one scanning parameter associated with the at least one portion of the subject for performing the scanning by the imaging device (506). Systems and methods for evaluating a scanning parameter are further provided. The methods may include determining a scanning parameter associated with the ROI (1606) and obtaining a reference scanning parameter associated with the ROI (1608). The methods may further include determining whether the scanning parameter needs to be adjusted by comparing the scanning parameter and the reference scanning parameter (1610).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.