Optical measuring method and optical measuring device
US11879725B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 11, 2019 |
| Grant date | Jan 23, 2024 |
| Priority date | — |
| Expiry date | May 2, 2040 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N13/221
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
The invention relates to an optical measuring method for three-dimensionally capturing the surface of an object by means of an optical capturing unit, wherein the optical capturing unit is moved relative to the object during a first measurement time period, the object is illuminated by the capturing unit with an illumination beam having a light intensity, height images are captured by the capturing unit in succession at a capturing frequency, at least some of the captured height images during the measurement time period are added to form a total height image and the total height image is displayed, and the light intensity and/or the capturing frequency are controlled during the measurement time period by control signals, the control signals being produced at time intervals during the measurement time period and each control signal being produced on the basis of at least one sensor signal of a temperature sensor.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.