Patent · US Active

Method for performing a test run on a test stand

US11879806B2 · kind B2 · utility

0Cited by

4References

20Claims

0Family size

Assignee

AVL LIST GMBH · AT

Inventors

Emre Kural · Graz, AT
Andreas Fleck · Garbsen, DE

Key dates

Filing date	Dec 9, 2019
Grant date	Jan 23, 2024
Priority date	—
Expiry date	May 23, 2040

Classification

Technology area (CPC G)Physics
CPC primaryG05B2219/35581
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

Various embodiments of the present disclosure are directed to a method for carrying out a test run on a test stand. The method in some embodiments reduces a deviation between a comparison simulation value and a comparison reference value when carrying out a test run on a test stand with a test object by simulating via a simulation unit a number of simulation values using a number of specified reference values starting from a selected reference value, determining a corrected reference value which is specified to the simulation unit for simulating a corrected simulation value and determining at least one setpoint variable using the corrected simulation value.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.