Measurement apparatus and method for controlling a measurement apparatus
US11879914B2 · kind B2 · utility
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8Claims
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Key dates
| Filing date | Nov 17, 2017 |
| Grant date | Jan 23, 2024 |
| Priority date | — |
| Expiry date | Feb 6, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R13/04
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A test arrangement and a method for controlling a measurement apparatus are provided. The measurement apparatus, in particular the triggering of the measurement apparatus is controlled by a state machine. If a desired state for triggering the measurement apparatus is not entered within a predetermined time period, the conditions for triggering the measurement apparatus can be adapted. For example, a required state for triggering can be changed or an automated triggering can be initiated.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.