Over the air (OTA) chip testing system
US11879925B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 14, 2021 |
| Grant date | Jan 23, 2024 |
| Priority date | — |
| Expiry date | Jan 1, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/303
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A test apparatus for testing device under test (DUT) having an antenna located on the DUT is disclosed. The test apparatus includes: a housing, a socket configured to electrically connect the DUT to a load board, a gripper assembly configured to hold the DUT in place, a retractor configured to release the DUT from the gripper assembly, and an alignment plate configured to align the DUT with the socket. The gripper assembly includes a base and an extender, the base is attached to the housing, and the extender is configured to hold the DUT in place. When the retractor is disengaged from the extender, the extender is configured to hold the DUT in place. When the retractor is engaged with the extender, the extender is configured to release the DUT on the alignment plate.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.