Patent · US Active

Method and apparatus for extracting downgoing wavelet and attenuation parameters by using vertical seismic data

US11880012B2 · kind B2 · utility

0Cited by
1References
9Claims
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Key dates

Filing dateJan 19, 2021
Grant dateJan 23, 2024
Priority date
Expiry dateJan 19, 2041

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01V2210/584
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method for extracting a downgoing wavelet and attenuation parameters from VSP data, comprising: performing upgoing and downgoing P-waves separation processing on VSP data to obtain downgoing P-wave data; performing a FFT on seismic data with a preset time window length and cut from the downgoing P-wave data to obtain FFT transformed downgoing P-wave data and a multi-trace downgoing P-wave log spectrum; subtracting a downgoing wavelet log spectrum from the multi-trace downgoing P-wave log spectrum to obtain a wavelet-corrected multi-trace downgoing P-wave log spectrum; performing a correction and an inverse FFT on the FFT transformed downgoing P-wave data to obtain a downgoing wavelet; and obtaining attenuation parameters based on P-wave first arrival time and the parameters of the wavelet-corrected multi-trace downgoing P-wave log spectrum. Also provided are an apparatus for extracting a downgoing wavelet and attenuation parameters from VSP data and a computer device.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.