Visual odometry for optical pattern scanning in a real scene
US11880738B1 · kind B1 · utility
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20Claims
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Key dates
| Filing date | Aug 17, 2022 |
| Grant date | Jan 23, 2024 |
| Priority date | — |
| Expiry date | Aug 17, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V2201/07
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Visual odometry is used for tracking an optical pattern outside a preview area of a camera. The optical pattern is detected in a first image, while the camera is at a first position. A second image is acquired while the camera is at a second position. A transformation is calculated that relates the first position to the second position. A location of the optical pattern in relation to the second image is calculated based on the transformation. Calculation of the transformation can be simplified by assuming that the camera is moved in a plane parallel to a plane having multiple optical patterns.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.