Distributed computing system for product defect analysis
US11880968B2 · kind B2 · utility
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17Claims
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Key dates
| Filing date | Dec 20, 2019 |
| Grant date | Jan 23, 2024 |
| Priority date | — |
| Expiry date | Oct 18, 2041 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02P90/30
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A distributed computing system for product defect analysis is disclosed. The distributed computing system for product defect analysis includes a computing cluster for processing product manufacturing messages, a computing cluster for identifying product defect, a product image database, and a client device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.