Method and system for determining plant leaf surface roughness
US11880994B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 11, 2021 |
| Grant date | Jan 23, 2024 |
| Priority date | — |
| Expiry date | Oct 5, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30168
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Provided is a method and system for determining plant leaf surface roughness. The method includes: acquiring a plurality of continuously captured zoomed-in leaf images by using a zoom microscope image capture system; determining a feature match set according to the zoomed-in leaf images; removing de-noised images of which the number of feature matches in feature match set is less than a second set threshold, to obtain n screened images; combining the n screened images to obtain a combined grayscale image; and determining plant leaf surface roughness according to the combined grayscale image. In the present disclosure, first, a plurality of zoomed-in leaf images are directly acquired by the zoom microscope image capture system quickly and accurately; the zoomed-in leaf images are then screened and combined to form a combined grayscale image; finally, three-dimensional roughness of a plant leaf surface is determined quickly and accurately according to the combined grayscale image.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.