Patent · US Active

Alkali semi-metal films and method and apparatus for fabricating them

US11881391B1 · kind B1 · utility

0Cited by

2References

7Claims

0Family size

Assignees

Radiation Monitoring Devices, Inc. · US
THE UNIVERSITY OF CHICAGO · US
Brookhaven Science Associates, LLC · US

Inventors

Harish B. Bhandari · Brookline, US
Vivek Nagarkar · Weston, US
Olena E. Ovechkina · Orleans, US
Henry J. Frisch · Chicago, US
Klaus Attenkofer · Riverhead, US
John Smedley · White Rock, US

Key dates

Filing date	Aug 13, 2021
Grant date	Jan 23, 2024
Priority date	—
Expiry date	Dec 22, 2041

Classification

Technology area (CPC H)Electricity
CPC primaryH02S50/15
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

Methods and systems for fabricating a film, such as, for example, a photocathode, having a tailored band structure and thin-film components that can be tailored for specific applications, such as, for example photocathode having a high quantum efficiency, and simple components fabricated by those methods.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.