Patent · US Active

System and method for manufacturing system data analysis

US11886177B1 · kind B1 · utility

1Cited by
5References
22Claims
0Family size

Assignee

Inventor

Key dates

Filing dateAug 28, 2023
Grant dateJan 30, 2024
Priority date
Expiry dateAug 28, 2043

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG05B2219/45026
  • WIPO fieldControl
  • WIPO sectorInstruments

Abstract

A method for manufacturing system data analysis, preferably including receiving a query, determining a set of digests, and/or determining a query result. The method can optionally include merging the set of digests and/or providing the query result. A system for manufacturing system data analysis, preferably including a set of machines, a plurality of digests, and/or a set of computing systems.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.