Intersection testing for ray tracing
US11887244B2 · kind B2 · utility
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19Claims
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Key dates
| Filing date | Dec 10, 2021 |
| Grant date | Jan 30, 2024 |
| Priority date | — |
| Expiry date | Dec 24, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2210/21
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A system and method for performing intersection testing of rays in a ray tracing system. The ray tracing system uses a hierarchical acceleration structure comprising a plurality of nodes, each identifying one or more elements for intersection testing. The system defines and updates progress information that identifies, for a ray, leaf nodes of the hierarchical acceleration structure which identify elements for which it is not yet known whether or not the ray interests.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.