Microscopic examination device and navigation method
US11887327B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Jun 7, 2022 |
| Grant date | Jan 30, 2024 |
| Priority date | — |
| Expiry date | Aug 26, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30164
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A microscopic examination device includes: a camera that images an observation area of an examination subject observed with a microscope device so as to acquire an image of the observation area; and one or more processors including hardware, the one or more processors being configured to: align the image of the observation area with an area in a reference image, the area corresponding to the image of the observation area; generate a navigation map from the reference image by recording, on the reference image, a position of the image of the observation area in the reference image; calculate a direction of movement to an unobserved area in the navigation map, the unobserved area being an area where the position of the image of the observation area is not recorded; and present an access method to the unobserved area on a basis of the direction of movement.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.