Device and method to measure temperature during tribological examination of materials
US11892361B2 · kind B2 · utility
0Cited by
3References
12Claims
0Family size
Assignee
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Key dates
| Filing date | Dec 15, 2021 |
| Grant date | Feb 6, 2024 |
| Priority date | — |
| Expiry date | Jul 29, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N33/30
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A device and method for measuring temperature during tribological examination of sample materials. More specifically, the device includes a sample holder that provides for surface temperature measurement for sample materials undergoing tribological testing.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.