Early detection of quality control test failures for manufacturing end-to-end testing optimization
US11892507B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 19, 2022 |
| Grant date | Feb 6, 2024 |
| Priority date | — |
| Expiry date | Oct 13, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG05B2219/32194
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Example embodiments are disclosed of systems and methods for predicting failure probabilities of future product tests of a testing sequence based on outcomes of prior tests. Predictions are made by a machine-learning-based model (MLM) trained with a set of test-result sequence records (TRSRs) including test values and pass/fail indicators (PRIs) of completed tests. Within training epochs over the set, iterations are carried out over each TRSR. Each iteration involves sub-iterations carried out successively over test results of the TRSR. Each sub-iteration involves (i) inputting to the MLM values of a given test and those of tests earlier in the sequence while masking those later in the sequence, (ii) computing probabilities of test failures for the masked tests found later in the sequence than the given test, and (iii) applying the PFIs of test results later in the sequence than the given test as ground-truths to update parameters of the MLM.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.