Device type classification using metric learning in weakly supervised settings
US11893456B2 · kind B2 · utility
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12Claims
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Key dates
| Filing date | Jun 7, 2019 |
| Grant date | Feb 6, 2024 |
| Priority date | — |
| Expiry date | May 28, 2042 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04L41/0893
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
In one embodiment, a device classification service receives telemetry data indicative of behavioral characteristics of a plurality of devices in a network. The service obtains side information for the telemetry data. The service applies metric learning to the telemetry data and side information, to construct a distance function. The service uses the distance function to cluster the telemetry data into device clusters. The service associates a device type label with a particular device cluster.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.