Patent · US Active

Method for structuring a decorative of technical pattern in an object made of an at least partially transparent amorphous, semi-crystalline or crystalline material

US11894215B2 · kind B2 · utility

0Cited by
2References
12Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 23, 2021
Grant dateFeb 6, 2024
Priority date
Expiry dateJul 23, 2041

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J2237/08
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method for structuring a decorative or technical pattern in the thickness of an object made of an at least partially transparent amorphous, semi-crystalline or crystalline material, wherein the object is made of an at least partially transparent material including a top surface and a bottom surface which extends away from the top surface. The top or bottom surfaces is provided with a mask defining an opening whose outline corresponds to the profile of the pattern to be structured, the mask covering the top or bottom surface at the positions which are not to be structured. The pattern is structured with a mono- or multicharged ion beam through the opening of the mask, wherein the mechanical properties of the mask are sufficient to prevent the ions of the ion beam from etching the top or bottom surface at the positions where this top or bottom surface is covered by the mask.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.