Test method and test device for mode field diameter
US11906387B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 10, 2019 |
| Grant date | Feb 20, 2024 |
| Priority date | — |
| Expiry date | Dec 4, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01M11/33
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The purpose of the present disclosure is to provide a mode field diameter test method and test device that enable acquisition of a mode field diameter for an arbitrary higher-order mode. The present disclosure is a mode field diameter test method including: a test light incidence procedure for selectively causing test light to be incident in a mode subject to measurement, on one end of an optical fiber 10 under test; a far-field pattern measurement procedure for measuring a far-field pattern of the mode subject to measurement, with respect to a divergence angle θ at the other end of the optical fiber under test, by a far-field scanning technique; and a mode field diameter calculation procedure for calculating, using an equation, a mode field diameter from information about incident mode orders in the test light incidence procedure and the far-field pattern measured in the far-field pattern measurement procedure.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.