Method and measurement instrument for testing a device under test
US11906583B2 · kind B2 · utility
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14Claims
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Key dates
| Filing date | Dec 8, 2021 |
| Grant date | Feb 20, 2024 |
| Priority date | — |
| Expiry date | Dec 8, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2029/5004
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention relates to a method for testing a device under test. A component of the device under test generates or receives a bus signal, wherein the bus signal comprises a first data signal or a second data signal, and wherein an amplitude of the first data signal is different from an amplitude of the second data signal. A measurement instrument measures an amplitude of the bus signal. Further, it is determined whether the bus signal comprises the first data signal or the second data signal, based on the measured amplitude of the bus signal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.