Methods and systems for performing built-in-self-test operations without a dedicated clock source

US11906585B2 · kind B2 · utility

Assignee

• SAMSUNG ELECTRONICS CO., LTD. · KR

Inventors

• A Santosh Kumar Reddy · Survanagiri, IN
• Gunjan Mandal · Survanagiri, IN
• Parin Rajnikant Bhuta · Kanchinakote, IN
• Raghavendra Molthati · Bengaluru, IN
• Saikat Hazra · Survanagiri, IN
• Sanjeeb Kumar Ghosh · Bengaluru, IN
• Sunil Rajan · Bengaluru, IN
• Krupal Jitendra Mehta · Survanagiri, IN
• Praveen S. Bharadwaj · Survanagiri, IN

Key dates

• Filing date: Apr 1, 2022
• Grant date: Feb 20, 2024
• Expiry date: Apr 23, 2042

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R31/31724
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

Built-in-self-test (BIST operations are performed by receiver lanes of a multilane receiver system, wherein at least one receiver lane is configured as a synthesized clock source for other receiver lanes configured to perform BIST operations. The at least one receiver lane configured as the synthesized clock source may generate a clock signal and provide the clock signal to the other receiver lanes performing the BIST operations. In some examples, digital control signals may be used for coordinating the enablement of the at least one receiver lane to function as the synthesized clock source and for coordinating the enablement of the other receiver lanes to perform BIST operations.