Approach for characterizing propagation of metallic short cracks and long cracks
US11907624B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 2, 2022 |
| Grant date | Feb 20, 2024 |
| Priority date | — |
| Expiry date | Nov 2, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2111/10
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for characterizing propagation of metallic short cracks and long cracks includes: acquiring crack tip opening displacement in a metallic notched sample under cyclic loading; acquiring crack tip opening displacement amount caused by a single monotonic tensile in the notched sample, and crack tip opening displacement caused by monotonic tensile in the notched sample under a maximum far-field stress; and based on an original Shyam model, constructing, according to the crack tip opening displacement amount and the crack tip opening displacement by obtaining yield strength of metals, a Tmφc model for characterizing the propagation of short cracks and long cracks, where the Tmφc model is used for representing the growth rate of short cracks and long cracks.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.