Standardizing analysis metrics across multiple devices
US11909611B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 20, 2022 |
| Grant date | Feb 20, 2024 |
| Priority date | — |
| Expiry date | Jul 20, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG10L2015/228
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Implementations relate to generating standardized metrics from device specific metrics that are generated during an interaction between a user and an automated assistant. The metrics indicate events that occurred while processing an interaction of a user with the automated assistant and are specific to the particular configuration of the device with which the user is interacting. Conversion mappings are determined based on device characteristics that can be utilized to convert the device metrics into standardized metrics. Analysis metrics are generated based on the standardized metrics that are incapable of being generated from the device metrics. Some implementations include visually rendering the analysis metrics such that one or more of the analysis metrics are rendered more prominently than other metrics.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.