Calibration object for an X-ray system
US11911206B2 · kind B2 · utility
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18Claims
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Key dates
| Filing date | Aug 23, 2019 |
| Grant date | Feb 27, 2024 |
| Priority date | — |
| Expiry date | Dec 20, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30201
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
Disclosed is a calibration object for an x-ray system and an optical system, the calibration object comprising: a first part made of a first material having a matte surface, the first material having a first attenuation coefficient of x-rays; a second part made of a second material having a second attenuation coefficient of x-rays different from the attenuation coefficient of the first material; wherein the first part is attached to the second part so that one or more features are detectable by one or more optical cameras.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.