Patent · US Active

Test element support

US11911768B2 · kind B2 · utility

0Cited by

3References

16Claims

0Family size

Assignee

Roche Diagnostics Operations, Inc. · US

Inventors

Reiner Stein · Bad Kreuznach, DE
Martin Mertens · Schriesheim, DE
Werner Heidt · Darmstadt, DE

Key dates

Filing date	Apr 10, 2019
Grant date	Feb 27, 2024
Priority date	—
Expiry date	Nov 23, 2039

Classification

Technology area (CPC H)Electricity
CPC primaryH05K2203/1115
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A test element support comprises a heating element for heating a test element for analytical examination of a sample. The heating element comprises a substrate, which is made of at least one substrate material. The substrate comprises at least one active area configured for being heated and at least one non-active area outside the active area. The active and the non-active areas are separated by at least one thermal insulation element. The thermal insulation element has a lower thermal conductivity than the substrate material. The thermal insulation element is fully or partially embedded into the substrate. The test element support further comprises at least one heater. The heater comprises at least one heater substrate and the heater substrate is attached to the substrate, wherein the heater substrate is attached to a back face of the substrate. The back face opposes a front face of the substrate contacting the test element.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.