Structure for pressurization analysis, X-ray diffraction apparatus and pressurization analysis system
US11913891B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Sep 23, 2021 |
| Grant date | Feb 27, 2024 |
| Priority date | — |
| Expiry date | Jul 12, 2042 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02E60/10
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A structure for pressurization analysis includes a sample accommodating unit (10) for accommodating an all-solid-state battery (S) therein, and a pressurizing unit (30) having a pressurizing mechanism for causing pressure to act on the all-solid-state battery (S). The all-solid-state battery (S) is pressurized inside the sample accommodating unit (10) while being sandwiched between a pressure receiving member (21) and a pressing member (22). Further, an X-ray window (14) is provided in an outer radial direction orthogonal to an acting direction of the pressure from the pressurizing unit (30), and reflection type X-ray diffraction measurement can be performed through the X-ray window (14).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.