Method for classification based diagnosis with partial system model information
US11915112B2 · kind B2 · utility
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17Claims
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Key dates
| Filing date | Sep 3, 2019 |
| Grant date | Feb 27, 2024 |
| Priority date | — |
| Expiry date | Oct 14, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06N5/01
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A classification-based diagnosis for detecting and predicting faults in physical system (e.g. an electronic circuit or rail switch) is disclosed. Some embodiments make use of partial system model information (e.g., system topology, components behavior) to simplify the classifier complexity (e.g., reduce the number of parameters). Some embodiments of the method use a Bayesian approach to derive a classifier structure.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.