Method and apparatus for inspecting tab appearance of cell assembly, and electronic device
US11915410B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 24, 2023 |
| Grant date | Feb 27, 2024 |
| Priority date | — |
| Expiry date | Apr 24, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30164
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method and an apparatus for inspecting tab appearance of cell assembly, an electronic device, a non-transitory computer-readable storage medium, and a computer program product are provided. The method includes: obtaining an image for inspection that includes a background region and a cell assembly image region, where the cell assembly image region includes a body zone and a plurality of tab stacking regions, each tab stacking region adjoining a top edge or a bottom edge of the body zone; determining each root corner of the plurality of tab stacking regions in the image for inspection; determining two side edges of the body zone in the image for inspection; determining at least one reference edge line in the image for inspection based on the two side edges of the body zone in the image for inspection; and determining result information of the tab appearance inspection based on each root corner of the plurality of tab stacking regions in the image for inspection and the at least one reference edge line.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.