Pixel location calibration image capture and processing
US11917309B2 · kind B2 · utility
0Cited by
3References
20Claims
0Family size
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Key dates
| Filing date | Mar 15, 2023 |
| Grant date | Feb 27, 2024 |
| Priority date | — |
| Expiry date | Mar 15, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG09G2330/10
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
What is disclosed are systems and methods for optical correction for correcting for non-uniformity in active matrix light emitting diode device (AMOLED) and other emissive displays, using iterative processing of images of calibration patterns including features of coarse and fine granularity to successively generate a high-resolution estimate of the panel pixel locations.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.