Patent · US Active

System and method for monitoring manufacturing

US11921014B2 · kind B2 · utility

0Cited by
8References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 19, 2022
Grant dateMar 5, 2024
Priority date
Expiry dateApr 19, 2042

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F16/907
  • WIPO fieldControl
  • WIPO sectorInstruments

Abstract

A method includes receiving raw data and generating a manufacturing data packet (MDP) that includes at least a portion of the raw data. Generating the MDP includes associating metadata with the raw data and associating a timestamp with the raw data. The timestamp is synchronized to a common reference time. A data model associated with the MDP is obtained. The data model includes one or more predefined data types and one or more predefined data fields. A first data type from the one or more predefined data types is determined based at least in part on characteristics of the raw data. An algorithm is determined based at least in part on the first data type. The MDP is processed according to the algorithm to produce an output. The first data type is associated with the raw data. The output is associated with a data field of the first data type.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.